CM-4 mini probe station
Mini size, modular design, for I-V/C-V, PIV test, optoelectronic test, up to 6 inch wafer, applicable to glove box
CS-4 small probe station
Small size, modular design, light weight, up to 6 inch wafer, for I-V/C-V, PIV, optoelectronic tests, applicable to glove box
CL-6 middle-sized probe station
Modular design, precise screw drive structure, up to 8 inch wafer, upgradable for RF test, high current test and laser repair applications.
CH-8 large-sized comprehensive probe station
Modular design, seamless upgrade, up to 12 inch wafer. Quick and fine-tuning lift function for chuck stage. Capable for Wafer test, PCB/IC test, RF test, high voltage and current tes
CH-12 large-sized comprehensive probe station
Modular design, seamless upgrade, up to 12 inch wafer, high precise screw drive structure, linear movement, quick and fine-tuning lift function for chuck stage, capable for Wafer test, PCB/IC test,
CW-4 high voltage and high current probe station
Modular design,up to 12 inch wafer, upgradable for RF test, high voltage and current test, laser repairing
CJ-4 high temperature probe station
Modular design, up to 500°C temperature with high stability,capable for IV/CV/RF tests
CT-6 non-vacuum high and low temperature probe station
Sealed chamber, optimized design with low liquid nitrogen consumption. No frost, high precise screw drive structure, linear movement.
CGO-Variable temperature vacuum probe station
High vacuum chamber, 77K-673K(liquid nitrogen)/4.5K-673K(liquid helium) temperature range, Compatible with IV/CV/RF test, radiation isolating design.
CBTZ semi-automatic alignment probe station
Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.