CM-4 mini probe station

Mini size, modular design, for I-V/C-V, PIV test, optoelectronic test, up to 6 inch wafer, applicable to glove box

CS-4 small probe station

Small size, modular design, light weight, up to 6 inch wafer, for I-V/C-V, PIV, optoelectronic tests, applicable to glove box

CL-6 middle-sized probe station

Modular design, precise screw drive structure, up to 8 inch wafer, upgradable for RF test, high current test and laser repair applications.

CH-8 large-sized comprehensive probe station

Modular design, seamless upgrade, up to 12 inch wafer. Quick and fine-tuning lift function for chuck stage. Capable for Wafer test, PCB/IC test, RF test, high voltage and current test.

CH-12 large-sized comprehensive probe station

Modular design, seamless upgrade, up to 12 inch wafer, high precise screw drive structure, linear movement, quick and fine-tuning lift function for chuck stage, capable for Wafer test, PCB/IC test,

CW-4 high voltage and high current probe station

Modular design，up to 12 inch wafer, upgradable for RF test, high voltage and current test, laser repairing

CJ-4 high temperature probe station

Modular design, up to 500°C temperature with high stability，capable for IV/CV/RF tests

CT-6 non-vacuum high and low temperature probe station

Sealed chamber, optimized design with low liquid nitrogen consumption. No frost, high precise screw drive structure, linear movement.

CGO-Variable temperature vacuum probe station

High vacuum chamber, 77K-673K(liquid nitrogen)/4.5K-673K(liquid helium) temperature range, Compatible with IV/CV/RF test, radiation isolating design.

CBTZ semi-automatic alignment probe station

Automatic alignment test on wafer, simple and fast operation, high resolution and MAP display function.